DETERMINATION OF THE TRACE ELEMENTS IN THE ACCESSORY MINERAL MICROCRYSTALS USING X-RAY FLUORESCENCE ANALYSIS IN ORDER TO PETROLOGICAL, GEOCHEMICAL, ENERGETICAL AND METALOGENIC INVESTIGATION OF THE EARTH CRUST EVOLUTION

Abstract

The new promising method of trace element concentration determination in accessory minerals XRF-MP/SG (single grain milliprobe X-ray fluorescence analysis) is considered. The method is compared with the modern microbeam methods (EMP, PMP, SHRIMP, SXRF, LAM-ICP-MS). The solution of XRF-MP/SG problem the x-ray fluorescence dependency on microcrystal composition, form and size is proposed. The possibilities of method application in the solution of the important theoretical and practical scientific problems are demonstrated.